The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 29, 2011

Filed:

Dec. 25, 2008
Applicant:

Ting-feng Su, Hsinchu, TW;

Inventor:

Ting-Feng Su, Hsinchu, TW;

Assignee:

Powertech Technology Inc., Hsinchu Industrial Park, Hukou Shiang, TW;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 3/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

An apparatus for drop testing is disclosed. The apparatus has a drop angle setting jig that horizontally moves on a support frame and positions a test object at a predetermined angle by clamping with a fixture. The jig provides a second datum plane and is connected to a moveable holding frame, with the holding frame providing a first datum plane. After the fixture clamps the testing object, the jig can be pulled back without touching the testing object, and the testing object stays still. Therefore, the testing object can be precisely positioned. Furthermore, with the sliding track and the stopping block, the jig is able to quickly return back to the reference position.


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