The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 18, 2011

Filed:

Sep. 30, 2008
Applicants:

Katrin Pietsch, Solms, DE;

Klaus-dieter Adam, Jena, DE;

Tillmann Ehrenberg, Schoeffengrund, DE;

Inventors:

Katrin Pietsch, Solms, DE;

Klaus-Dieter Adam, Jena, DE;

Tillmann Ehrenberg, Schoeffengrund, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 11/02 (2006.01); G01N 21/01 (2006.01);
U.S. Cl.
CPC ...
Abstract

A device for measuring the position of at least one structure on a substrate is disclosed. The substrate to be measured is positioned in a mirror body. A flat insert is provided in the mirror body and is formed such that the substrate and the insert together always have the same optical thickness, irrespective of the mechanical thickness of the substrate.


Find Patent Forward Citations

Loading…