The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 21, 2010

Filed:

Nov. 21, 2007
Applicants:

Alexander E. Andreev, San Jose, CA (US);

Anatoli A. Bolotov, Cupertino, CA (US);

Ranko Scepanovic, Saratoga, CA (US);

Inventors:

Alexander E. Andreev, San Jose, CA (US);

Anatoli A. Bolotov, Cupertino, CA (US);

Ranko Scepanovic, Saratoga, CA (US);

Assignee:

LSI Corporation, Milpitas, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A memory testing system for testing a plurality of memory locations in an electronic memory device is provided. The system includes a programmable memory device integrated into the electronic memory device capable of receiving and storing a compiled memory testing program. A processor is in communication with the programmable memory device to read and execute instructions from the compiled testing program stored in the programmable memory device and a command interpreter is configured to receive data from the processor related to commands to be executed during memory testing.


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