The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 23, 2010
Filed:
Aug. 18, 2008
Lawrence A. Clevenger, LaGrangeville, NY (US);
Matthew E. Colburn, Hopewell Junction, NY (US);
Timothy J. Dalton, Ridgefield, CT (US);
Michael C. Gaidis, Wappingers Falls, NY (US);
Louis L. C. Hsu, Fishkill, NY (US);
Carl Radens, LaGrangeville, NY (US);
Keith Kwong Hon Wong, Wappingers Falls, NY (US);
Chih-chao Yang, Glenmont, NY (US);
Lawrence A. Clevenger, LaGrangeville, NY (US);
Matthew E. Colburn, Hopewell Junction, NY (US);
Timothy J. Dalton, Ridgefield, CT (US);
Michael C. Gaidis, Wappingers Falls, NY (US);
Louis L. C. Hsu, Fishkill, NY (US);
Carl Radens, LaGrangeville, NY (US);
Keith Kwong Hon Wong, Wappingers Falls, NY (US);
Chih-Chao Yang, Glenmont, NY (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A method of forming a stochastically based integrated circuit encryption structure includes forming a lower conductive layer over a substrate, forming a short prevention layer over the lower conductive layer, forming an intermediate layer over the short prevention layer, wherein the intermediate layer is characterized by randomly structured nanopore features. An upper conductive layer is formed over the random nanopore structured intermediate layer. The upper conductive layer is patterned into an array of individual cells, wherein a measurable electrical parameter of the individual cells has a random distribution from cell to cell with respect to a reference value of the electrical parameter.