The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 19, 2010

Filed:

Nov. 13, 2008
Applicants:

Jen-shou Hsu, Hsinchu, TW;

Kuo-cheng Ting, Hsinchu County, TW;

Inventors:

Jen-Shou Hsu, Hsinchu, TW;

Kuo-Cheng Ting, Hsinchu County, TW;

Assignee:

Etron Technology, Inc., Hsinchu, TW;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G11C 29/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A testing system with data compressing function includes a third data end, a first encoder, and a second encoder. The testing system receives testing data and testing address for testing if any memory cell fails in a memory. The memory includes a first data end, a second end, and an address end. The first encoder encodes the testing data to the data type of the first data end according to the testing address. The second encoder encodes the testing data to the data type of the second data end according to the testing address. In this way, the corresponding memory cells of the first data and second ends store same testing data.


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