The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 05, 2010
Filed:
Mar. 22, 2007
Applicants:
Jianhong Zhu, Austin, TX (US);
Dorel Ioan Toma, Dripping Springs, TX (US);
Inventors:
Jianhong Zhu, Austin, TX (US);
Dorel Ioan Toma, Dripping Springs, TX (US);
Assignee:
Tokyo Electron Limited, Tokyo, JP;
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 13/00 (2006.01); B01D 59/12 (2006.01); C23C 16/52 (2006.01);
U.S. Cl.
CPC ...
Abstract
A method and system for diagnosing the effectiveness of a treatment on a porous material. For example, the porous material can include a porous low dielectric constant material. In particular, the method can utilize FTIR spectroscopy to characterize the porosity of materials, and assess the effectiveness of sealing pores in the material.
Zhu, Jianhong. (2010). Method and system for characterizing porous materials (U.S. Patent No. 7807213). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7807213
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile