The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 14, 2010

Filed:

Jun. 01, 2006
Applicants:

Chin-hsiang Lin, Hsin-Chu, TW;

Jui-chung Peng, Hsin-Chu, TW;

Yung-cheng Chen, Hsin-Chu, TW;

Shy-jay Lin, Hsin-Chu, TW;

Inventors:

Chin-Hsiang Lin, Hsin-Chu, TW;

Jui-Chung Peng, Hsin-Chu, TW;

Yung-Cheng Chen, Hsin-Chu, TW;

Shy-Jay Lin, Hsin-Chu, TW;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
C12Q 1/68 (2006.01); H01J 40/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present disclosure provides a lithography apparatus with improved lithography throughput. The lithography apparatus includes a first lens system; a first substrate stage configured to receive a first radiation energy from the first lens system, and designed operable to move a substrate during an exposing process; a second lens system, having a higher resolution than that of the first lens system; and a second substrate stage approximate to the first substrate stage and configured to receive a second radiation energy from the second lens system, and designed operable to receive the substrate from the first substrate stage and move the substrate.


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