The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 20, 2010

Filed:

Dec. 10, 2007
Applicants:

Tomohiro Kitano, Tokyo, JP;

Hisayuki Nagamine, Tokyo, JP;

Inventors:

Tomohiro Kitano, Tokyo, JP;

Hisayuki Nagamine, Tokyo, JP;

Assignee:

Elpida Memory, Inc., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/50 (2006.01);
U.S. Cl.
CPC ...
Abstract

A design method of a semiconductor device is provided with a mask region setting step of setting a mask region to a layout of the semiconductor device, a parasitic parameter changing step of setting parasitic parameters of a wiring part within the mask region to zero, and a parasitic parameter extraction step of extracting parasitic parameters of either the total layout or a specific part of the layout. The parasitic parameter changing step includes a virtual wiring layer generation step of generating a virtual wiring layer corresponding to the actual wiring layer of the semiconductor device, a parasitic parameter definition step of defining the parasitic parameters of the virtual wiring layer as zero, and a wiring layer conversion step of converting the wiring part within the mask region of the wiring of the actual wiring layer, to the wiring part of the virtual wiring layer.


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