The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 13, 2010
Filed:
Oct. 19, 2007
Jun Zhao, Allentown, PA (US);
Yanhua Yi, Allentown, PA (US);
Eric Ting, Macungie, PA (US);
Lattice Semiconductor Corporation, Hillsboro, OR (US);
Abstract
Systems and methods provide techniques to support design specific testing for programmable logic devices in accordance with one or more embodiments. For example in one embodiment, a method of generating configuration data for a programmable logic device includes mapping a design for the programmable logic device, wherein the mapped design incorporates scan test logic; placing and routing the mapped design; and generating configuration data based on the mapped design, wherein the incorporated scan test logic is disabled and not selectable within the programmable logic device configured with the configuration data. The method may further include generating a second configuration data based on the mapped design, wherein the incorporated scan test logic is enabled and selectable within the programmable logic device configured with the second configuration data.