The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 29, 2010

Filed:

May. 19, 2008
Applicants:

John A. Mclean, Bryan, TX (US);

David H. Russell, College Station, TX (US);

Thomas F. Egan, Houston, TX (US);

Michael V. Ugarov, Houston, TX (US);

J. Albert Schultz, Houston, TX (US);

Inventors:

John A. McLean, Bryan, TX (US);

David H. Russell, College Station, TX (US);

Thomas F. Egan, Houston, TX (US);

Michael V. Ugarov, Houston, TX (US);

J. Albert Schultz, Houston, TX (US);

Assignees:

Ionwerks, Inc., Houston, TX (US);

Texas A&M University System, College Station, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 49/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method and apparatus for multiplexed data acquisition for gas-phase ion mobility coupled with mass spectrometry is described. Ion packets are injected into an ion mobility drift chamber at a rate faster than the ion mobility separation arrival time distribution. The convoluted arrival time distributions thus generated are deconvoluted by a mass spectrometer and post-processing algorithms.


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