The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 22, 2010

Filed:

Jan. 30, 2008
Applicants:

Janusz Rajski, West Linn, OR (US);

Jerzy Tyszer, 61-249 Poznan, PL;

Chen Wang, Tigard, OR (US);

Grzegorz Mrugalski, Wilsonville, OR (US);

Artur Pogiel, 89-200 Szubin, PL;

Inventors:

Janusz Rajski, West Linn, OR (US);

Jerzy Tyszer, 61-249 Poznan, PL;

Chen Wang, Tigard, OR (US);

Grzegorz Mrugalski, Wilsonville, OR (US);

Artur Pogiel, 89-200 Szubin, PL;

Assignee:

Other;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present disclosure describes embodiments of a compactor for compressing test results in an integrated circuit and methods for using and designing such embodiments. The disclosed compactors can be utilized, for example, as part of any scan-based design. Moreover, any of the disclosed compactors can be designed, simulated, and/or verified in a computer-executed application, such as an electronic-design-automation ('EDA') software tool. Embodiments of a method for diagnosing faults in the disclosed compactor embodiments are also described.


Find Patent Forward Citations

Rajski, Janusz. (2010). Compressing test responses using a compactor (U.S. Patent No. 7743302). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7743302

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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