The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 22, 2010
Filed:
Oct. 26, 2008
Applicants:
Sandeep Bhatia, San Jose, CA (US);
Oriol Roig, Sunnyvale, CA (US);
Inventors:
Sandeep Bhatia, San Jose, CA (US);
Oriol Roig, Sunnyvale, CA (US);
Assignee:
Cadence Design Systems, Inc., San Jose, CA (US);
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01);
U.S. Cl.
CPC ...
Abstract
In one embodiment of the invention, a method of scan testing an integrated circuit is disclosed. The method includes scanning a first test vector and a second test vector sequentially into a plurality of scan registers serially coupled together, each of the plurality of scan registers including a master latch, a scan latch, and a functional latch; and applying the first and the second test vectors sequentially in a delay fault test via the plurality of scan registers to a combinational logic circuit coupled to the plurality of scan registers.