The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 22, 2010

Filed:

Nov. 28, 2002
Applicants:

Yasuhiro Yamakoshi, Ibaraki, JP;

Hirohito Miyashita, Ibaraki, JP;

Inventors:

Yasuhiro Yamakoshi, Ibaraki, JP;

Hirohito Miyashita, Ibaraki, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
C22C 19/03 (2006.01);
U.S. Cl.
CPC ...
Abstract

Provided is high purity nickel or nickel alloy target for magnetron sputtering having superior sputtering film uniformity and in which the magnetic permeability of the target is 100 or more, and this high purity nickel or a nickel alloy target for magnetron sputtering capable of achieving a favorable film uniformity (evenness of film thickness) and superior in plasma ignition (firing) even during the manufacturing process employing a 300 mm wafer. The present invention also provides the manufacturing method of such high purity nickel or nickel alloy target.


Find Patent Forward Citations

Yamakoshi, Yasuhiro. (2010). Target of high-purity nickel or nickel alloy and its producing method (U.S. Patent No. 7740718). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7740718

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…