The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 15, 2010
Filed:
Jan. 12, 2007
Soroush Abbaspour, Fishkill, NY (US);
Gregory M. Schaeffer, Poughkeepsie, NY (US);
Chandramouli Visweswariah, Croton-on-Hudson, NY (US);
Soroush Abbaspour, Fishkill, NY (US);
Gregory M. Schaeffer, Poughkeepsie, NY (US);
Chandramouli Visweswariah, Croton-on-Hudson, NY (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
In one embodiment, the invention is a method and apparatus for static timing analysis in the presence of a coupling event and process variation. One embodiment of a method for computing a statistical change in delay and slew due to a coupling event between two adjacent nets in an integrated circuit design includes conducting a statistical timing analysis of the integrated circuit design, computing a statistical overlap window between the adjacent nets, where the statistical timing window represents a period of time during which signals on the adjacent nets can switch contemporaneously and computing the statistical change of delay due to the coupling event, in accordance with the statistical overlap window.