The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 01, 2010

Filed:

Mar. 09, 2007
Applicants:

Hua-shu Wu, Hsinchu, TW;

Tsung-mu Lai, Chu-Pei, TW;

Ming-chih Chang, Pingtung County, TW;

Che-rong Laing, Taipei, TW;

Inventors:

Hua-Shu Wu, Hsinchu, TW;

Tsung-Mu Lai, Chu-Pei, TW;

Ming-Chih Chang, Pingtung County, TW;

Che-Rong Laing, Taipei, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 41/113 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method and a structure are provided for preventing lift-off of a semiconductor monitor pattern from a substrate. A semiconductor structure and a semiconductor monitor structure are formed on a substrate. A material layer is formed covering the semiconductor monitor structure. A part of the semiconductor structure is removed without removing the semiconductor monitor structure, by using the material layer as an etch protection layer. A mask for the method is also provided. The mask includes a clear area and a dark area. The dark area prevents a semiconductor monitor structure from being subjected to exposure so as to form a material layer covering the semiconductor monitor structure and prevent removal of the semiconductor monitor structure from the substrate while a part of a semiconductor structure is removed.


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