The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 18, 2010

Filed:

Oct. 19, 2007
Applicants:

Gary D. Grise, Colchester, VT (US);

Vikram Iyengar, South Burlington, VT (US);

David E. Lackey, Jericho, VT (US);

Mark R. Taylor, Essex Junction, VT (US);

Inventors:

Gary D. Grise, Colchester, VT (US);

Vikram Iyengar, South Burlington, VT (US);

David E. Lackey, Jericho, VT (US);

Mark R. Taylor, Essex Junction, VT (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01);
U.S. Cl.
CPC ...
Abstract

An apparatus for selectively implementing launch-off-scan capability in at-speed testing of integrated circuit devices includes a control device configured to selectively disable a master clock signal of a latch structure under test such that a pulse sequence of a system clock signal results in a slave-master-slave clock pulse sequence in the latch structure under test; wherein the control device utilizes the system clock signal as an input thereto and operates in a self-resetting fashion that is timing independent with respect to a scan chain.


Find Patent Forward Citations

Loading…