The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 11, 2010
Filed:
Jan. 17, 2003
Guangzhou Zou, San Diego, CA (US);
Hur-song Chang, San Diego, CA (US);
Yiping Fan, San Diego, CA (US);
Fan Long, Bridgewater, NJ (US);
Xun Wang, Chapel Hill, NC (US);
Tong Zhu, Chapel Hill, NC (US);
Guangzhou Zou, San Diego, CA (US);
Hur-Song Chang, San Diego, CA (US);
Yiping Fan, San Diego, CA (US);
Fan Long, Bridgewater, NJ (US);
Xun Wang, Chapel Hill, NC (US);
Tong Zhu, Chapel Hill, NC (US);
Syngenta Participations AG, Basel, CH;
Abstract
Individual probes on micro-arrays are re-scaled and corrected with a set of probe dependent coefficients derived from genomic-DNA hybridization signals. A dynamic range for gDNA binding is determined by measuring a concentration signal curve. Signals for each probe are measured during multiple hybridizations within a linear range. Concentration insensitive probes are then found for two sets of experiments. Probes are discarded based on a threshold compared to their standard deviation divided by their average in each set. The correction coefficients are used to calculate a corrected intensity for each probe. Probes having high uncertainty (0.5 in one embodiment) are discarded. A weighting factor for each probe is determined along with an uncertainty factor. Finally, a call for each gene is made, such as absent, marginal or present.