The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 13, 2010
Filed:
Jan. 31, 2008
Applicants:
Michael Heiden, Wolfersheim, DE;
Klaus Rinn, Heuchelheim, DE;
Inventors:
Michael Heiden, Wolfersheim, DE;
Klaus Rinn, Heuchelheim, DE;
Assignee:
Vistec Semiconductor Systems GmbH, Weilburg, DE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 5/004 (2006.01); G01B 21/04 (2006.01); G06F 19/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
A method is disclosed for eliminating sources of error in the system correction of a coordinate measuring machine. Herein, a number j of reference structureson a rigid reference objectare measured in a starting orientation k=0, and the starting coordinates and the reference coordinates of the reference structureson the reference objectare determined in a number k≧3 of mutually different orientations.
Heiden, Michael. (2010). Method for eliminating sources of error in the system correction of a coordinate measuring machine (U.S. Patent No. 7694426). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7694426
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