The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 30, 2010

Filed:

Sep. 10, 2007
Applicant:

Narendra V. Shenoy, Cupertino, CA (US);

Inventor:

Narendra V. Shenoy, Cupertino, CA (US);

Assignee:

Synopsys, Inc., Mountain View, CA (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 17/50 (2006.01);
U.S. Cl.
CPC ...
Abstract

Statistical timing analysis techniques can be used to lead to the construction of robust circuits in a consistent manner through the entire design flow of synthesis, placement and routing. An exemplary technique can include receiving library data for a design including timing models. By comparing implementations of this data, a robust circuit can be defined based on a set of criteria, which can include worst negative slack, endpoint slack distribution, timing constraint violations, and total negative slack. At this point, statistical timing analysis can be used to drive logic changes that generate improved robustness in the design. The statistical timing analysis can use a static timing delay associated with the arc in statistical timing analysis as a mean and a specified percentage of the mean as the standard deviation.


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