The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 23, 2010

Filed:

Jun. 20, 2005
Applicants:

Allen White, Austin, TX (US);

Hemanshu T. Vernenker, Austin, TX (US);

Louis DE LA Cruz, Pflugerville, TX (US);

Inventors:

Allen White, Austin, TX (US);

Hemanshu T. Vernenker, Austin, TX (US);

Louis De La Cruz, Pflugerville, TX (US);

Assignee:

Lattice Semiconductor Corporation, Hillsboro, OR (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/3177 (2006.01); G01R 31/40 (2006.01);
U.S. Cl.
CPC ...
Abstract

Systems and methods are disclosed herein to provide test features for integrated circuits. For example, in accordance with an embodiment of the present invention, an integrated circuit includes an input signal path adapted to route an address signal for a configurable memory. An input multiplexer, coupled to the input signal path, is controllable to route a first test signal provided via the input signal path for at least one memory configuration that does not use the input signal path for the address signal.


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