The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 16, 2010

Filed:

Nov. 15, 2004
Applicants:

Boon Hong Sim, Singapore, SG;

Ping Zhou, Singapore, SG;

Inventors:

Boon Hong Sim, Singapore, SG;

Ping Zhou, Singapore, SG;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G05B 23/02 (2006.01); G05B 15/00 (2006.01); G05B 11/01 (2006.01); G06F 19/00 (2006.01); G06F 11/00 (2006.01); H04Q 5/22 (2006.01); H04J 3/16 (2006.01); H04J 3/22 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present invention discloses a new data collection method employed by a middle layer between the host and the equipment, which improves the speed and consistency of data collection. The middle layer incorporated with the proposed data collection method functions as a data format converter as well as a data processor/classifier, which helps to filter and format messages before delivering data to the host or equipment. The proposed data collection method enables the middle layer to perform local reply, local data sampling, and group data polling, thus relieving processing resources of both the equipment and the host. This allows implementation of APC on older wafer fabrication processes using old equipment.


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