The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 09, 2010
Filed:
Dec. 16, 2005
Chi Kit Ronald Chung, Shatin, HK;
Jun Cheng, Shatin, HK;
Y. Edmund Lam, Pokfulam Road, HK;
Shun Ming Kenneth Fung, Kwai Chung, HK;
Fan Wang, Kwai Chung, HK;
Wing Hong Leung, Kwai Chung, HK;
Chi Kit Ronald Chung, Shatin, HK;
Jun Cheng, Shatin, HK;
Y. Edmund Lam, Pokfulam Road, HK;
Shun Ming Kenneth Fung, Kwai Chung, HK;
Fan Wang, Kwai Chung, HK;
Wing Hong Leung, Kwai Chung, HK;
ASM Assembly Automation Ltd., Hong Kong, HK;
Abstract
A system for three-dimensional reconstruction of a surface profile of a surface of an object is provided that utilizes a binary pattern projected onto the surface of the object. A binary string consisting of a series of '1's and '0's is first created, and a binary pattern of light that is constructed in accordance with the binary string such that bright and dark bands of light of equal widths correspond to “1”s and “0”s from the binary string respectively is projected onto the surface. The binary pattern is shifted with respect to the surface multiple times, during which an image of the binary pattern illuminating the surface is obtained at each position of the binary pattern. Thereafter, a height of each predetermined point on the surface is calculated relative to a reference plane based upon the images cumulatively obtained at said predetermined point.