The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 23, 2010

Filed:

Mar. 02, 2006
Applicants:

Kengo Imagawa, Fujisawa, JP;

Masami Makuuchi, Yokohama, JP;

Ritsuro Orihashi, Tokyo, JP;

Yoshiharu Ikeda, Tokorozawa, JP;

Koichiro Eguchi, Hitachinaka, JP;

Inventors:

Kengo Imagawa, Fujisawa, JP;

Masami Makuuchi, Yokohama, JP;

Ritsuro Orihashi, Tokyo, JP;

Yoshiharu Ikeda, Tokorozawa, JP;

Koichiro Eguchi, Hitachinaka, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 11/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

In order to easily perform a timing test on a memory interface included in a semiconductor device so as to satisfy a restriction on latency, the present invention provides a semiconductor device with the memory interface including: a clock output terminal that outputs a clock signal associated with an operation of a memory connected to the memory interface; a command terminal that outputs a command signal associated with control of a state of the memory; a data terminal that exchanges a data signal with the memory; and a data strobe terminal that exchanges a data strobe signal for establishing the data signal. This semiconductor device includes a testing terminal that outputs in advance a signal for starting a test on the memory interface apart from the command signal.


Find Patent Forward Citations

Loading…