The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 23, 2010

Filed:

Feb. 20, 2007
Applicants:

Doug Van Den Broeke, Sunnyvale, CA (US);

Chungwei Hsu, Taipei, TW;

Jang Fung Chen, Cupertino, CA (US);

Inventors:

Doug Van Den Broeke, Sunnyvale, CA (US);

Chungwei Hsu, Taipei, TW;

Jang Fung Chen, Cupertino, CA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/86 (2006.01); G03F 1/00 (2006.01); G06F 17/50 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method of generating masks for printing a pattern including a plurality of features having varying critical dimensions. The method includes the steps of: (1) obtaining data representing the pattern; (2) defining a plurality of distinct zones based on the critical dimensions of the plurality of features; (3) categorizing each of the features into one of the plurality of distinct zones; and (4) modifying the mask pattern for each feature categorized into a predefined distinct zone of the plurality of distinct zones.


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