The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 09, 2010
Filed:
Apr. 27, 2004
Wilfred Marcellien Bourg, Jr., Melissa, TX (US);
Steven Andrew Bresnahan, Plano, TX (US);
Paul Allan Martin, Celina, TX (US);
John F. Macgregor, Dundas, CA;
Honglu Yu, Fort Erie, CA;
Mark-john Bruwer, Hamilton, CA;
Wilfred Marcellien Bourg, Jr., Melissa, TX (US);
Steven Andrew Bresnahan, Plano, TX (US);
Paul Allan Martin, Celina, TX (US);
John F. MacGregor, Dundas, CA;
Honglu Yu, Fort Erie, CA;
Mark-John Bruwer, Hamilton, CA;
Frito-Lay North America, Inc., Plano, TX (US);
Abstract
A method for extracting feature information from product images using multivariate image analysis (MIA) to develop predictive models for organoleptic and other feature content and distribution on the imaged product. The imaging system is used to monitor product quality variables in an on-line manufacturing environment. The method may also be integrated into a closed-loop feedback control system in automated systems.