The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 26, 2010

Filed:

Apr. 18, 2005
Applicants:

Neng-kuo Chen, Hsin-Chu, TW;

Teng-chun Tsai, Hsin-Chu, TW;

Hsiu-lien Liao, Tai-Chung, TW;

Inventors:

Neng-Kuo Chen, Hsin-Chu, TW;

Teng-Chun Tsai, Hsin-Chu, TW;

Hsiu-Lien Liao, Tai-Chung, TW;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
C23C 16/40 (2006.01); B05D 3/00 (2006.01); H01L 21/469 (2006.01);
U.S. Cl.
CPC ...
Abstract

Preventing a chemical vapor deposition (CVD) chamber from particle contamination in which a higher low-frequency radio frequency (LFRF) power and longer process time are provided to vacate the chamber and perform a pre-heat process. Following that, a pre-oxide layer is formed on the chamber wall, while a high-frequency radio frequency bias is provided to the chamber. The high-power LFRF is continuously provided to the chamber to sustain the temperature of the chamber, and then a main oxide layer deposition process is performed. The method is able to form an oxide layer of better quality on a CVD chamber wall, so as to solve the particle problem in the prior art. Therefore, yield is improved and the maintenance cost is reduced.


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