The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7646471 B1

PDF
Full Text
Expired
Date of Patent:
Jan. 12, 2010

Filed:

Jun. 15, 2007
Applicants:

Paulus Antonius Andreas Teunissen, Eindhoven, NL;

Petrus Johannes Maria Broodbakker, Eindhoven, NL;

Rene Marinus Gerardus Johan Queens, Eindhoven, NL;

Assignee:

ASML Netherlands B.V., Veldhoven, NL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03B 27/52 (2006.01); G03B 27/54 (2006.01);
U.S. Cl.
CPC ...
Abstract

A level sensor for a lithographic projection apparatus according to one embodiment of the invention includes a light source, a first reflector, a second reflector and a detector. The first reflector is positioned to direct light from the light source towards a wafer surface, and the second reflector is positioned to direct light reflected from the wafer surface to the detector. The first and second reflectors are selected to incur a minimal process dependent apparent surface depression.


Find Patent Forward Citations

Teunissen, Paulus Antonius Andreas. (2010). Lithographic apparatus, level sensor, method of inspection, device manufacturing method, and device manufactured thereby (U.S. Patent No. 7646471). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7646471

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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