The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 15, 2009
Filed:
Jul. 18, 2008
Yoshiki Matoba, Chiba, JP;
Yutaka Ikku, Chiba, JP;
Yoshiki Matoba, Chiba, JP;
Yutaka Ikku, Chiba, JP;
SII NanoTechnology Inc., Chiba, JP;
Abstract
Provided are an X-ray tube and an X-ray analysis apparatus, which can be further reduced in size as well as in weight and more efficiently detect a fluorescent X-ray and the like to increase sensitivity. The X-ray tube includes: a vacuum casing () having an interior in a vacuum state and a window section () formed of an X-ray transmission film through which an X-ray can be transmitted; an electron beam source () provided in the vacuum casing (), to emit an electron beam (e); a target (T) provided in the vacuum casing () to be irradiated with the electron beam (e) to generate a primary X-ray and to be able to emit the generated primary X-ray through the window section () to an exterior sample (S); an X-ray detection element () provided in the vacuum casing () to be able to detect a fluorescent X-ray and a scattered X-ray, which are emitted from the sample (S) to be incident through the window section (), to output a signal containing energy information of the fluorescent X-ray and the scattered X-ray; and a metal guard member () provided between the X-ray detection element () and an irradiated area of the target (T) with the electron beam (e).