The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 20, 2009
Filed:
Jul. 27, 2004
Applicants:
Soowan Suh, San Ramon, CA (US);
Jing Ling, Fremont, CA (US);
Juan-carlos Calderon, Fremont, CA (US);
Rodrigo Gonzalez, Concord, CA (US);
Inventors:
Soowan Suh, San Ramon, CA (US);
Jing Ling, Fremont, CA (US);
Juan-Carlos Calderon, Fremont, CA (US);
Rodrigo Gonzalez, Concord, CA (US);
Assignee:
Intel Corporation, Santa Clara, CA (US);
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04J 3/06 (2006.01); H04L 12/28 (2006.01); H04L 12/56 (2006.01);
U.S. Cl.
CPC ...
Abstract
A method and apparatus for determining a loss of alignment defect in a communications network employing virtually concatenated payloads is provided. The method and apparatus comprise performing specific evaluations and assessments of conditions under normal conditions as well as evaluations and assessments under LCAS conditions where additional members may be added using the LCAS ADD state.