The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 13, 2009
Filed:
Sep. 28, 2004
Satish Narayanasamy, La Jolla, CA (US);
Hong Wang, Santa Clara, CA (US);
John Shen, San Jose, CA (US);
Roni Rosner, Binyamina, IL;
Yoav Almog, Haifa, IL;
Naftali Schwartz, Yaakov, IL;
Gerolf Hoflehner, Santa Clara, CA (US);
Daniel Lavery, Santa Clara, CA (US);
Wei LI, Redwood, CA (US);
Xinmin Tian, Union City, CA (US);
Milind Girkar, Sunnyvale, CA (US);
Perry Wang, San Jose, CA (US);
Satish Narayanasamy, La Jolla, CA (US);
Hong Wang, Santa Clara, CA (US);
John Shen, San Jose, CA (US);
Roni Rosner, Binyamina, IL;
Yoav Almog, Haifa, IL;
Naftali Schwartz, Yaakov, IL;
Gerolf Hoflehner, Santa Clara, CA (US);
Daniel LaVery, Santa Clara, CA (US);
Wei Li, Redwood, CA (US);
Xinmin Tian, Union City, CA (US);
Milind Girkar, Sunnyvale, CA (US);
Perry Wang, San Jose, CA (US);
Intel Corporation, Santa Clara, CA (US);
Abstract
Embodiments of the present invention provide a method, apparatus and system which may include splitting a dependency chain into a set of reduced-width dependency chains; mapping one or more dependency chains onto one or more clustered dependency chain processors, wherein an issue-width of one or more of the clusters is adapted to accommodate a size of the dependency chains; and/or processing in parallel a plurality of dependency chains of a trace. Other embodiments are described and claimed.