The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7601947 B1

PDF
Full Text
Expired
Date of Patent:
Oct. 13, 2009

Filed:

May. 11, 2007
Applicants:

Susumu Makinouchi, Zama, JP;

Toru Imai, Natori, JP;

Akihiro Watanabe, Sendai, JP;

Inventors:

Susumu Makinouchi, Zama, JP;

Toru Imai, Natori, JP;

Akihiro Watanabe, Sendai, JP;

Assignee:

Nikon Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 9/02 (2006.01);
U.S. Cl.
CPC ...
Abstract

When an incident light is obliquely incident on an index scale, the optical path length of light A becomes longer than the optical path length of light B and an optical path length difference occurs, which causes a phase difference in both of the diffracted lights incident on a photodetection element. According to the phase difference, intensity of a photoelectric detection signal output from the photodetection element changes. That is, due to a periodic change in the incident angle of the incident light, the phase difference between light A and light B is modulated, and the interference signal becomes greatly modulated.


Find Patent Forward Citations

Makinouchi, Susumu. (2009). Encoder that optically detects positional information of a scale (U.S. Patent No. 7601947). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7601947

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