The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 13, 2009
Filed:
Aug. 17, 2007
Applicants:
Boris Yokhin, Nazareth Illit, IL;
Alexander Krokhmal, Haifa, IL;
Asher Peled, Eyen Yehuda, IL;
David Berman, Kiryat Tivon, IL;
Inventors:
Boris Yokhin, Nazareth Illit, IL;
Alexander Krokhmal, Haifa, IL;
Asher Peled, Eyen Yehuda, IL;
David Berman, Kiryat Tivon, IL;
Assignee:
Jordan Valley Semiconductors Ltd., Migdal Ha'emek, IL;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 6/08 (2006.01); G01N 23/201 (2006.01);
U.S. Cl.
CPC ...
Abstract
A method for X-ray analysis of a sample includes directing a beam of X-rays to impinge on a structure in the sample such that the X-rays are scattered from the structure in a pattern of stripes, and receiving the scattered X-rays using an array of detectors. A relative alignment between the sample and the array is adjusted so that the stripes are parallel to the detectors.