The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 12, 2009

Filed:

Oct. 20, 2005
Applicants:

Wen-hsien Huang, Tainan County, TW;

Min-chieh Yang, Kaohsiung, TW;

Jiunn-hsing Liao, Tainan County, TW;

Inventors:

Wen-Hsien Huang, Tainan County, TW;

Min-Chieh Yang, Kaohsiung, TW;

Jiunn-Hsing Liao, Tainan County, TW;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/26 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for increasing the removal rate of a photoresist layer used as an ion implant mask. The method includes performing a pre-treatment of a substrate, such as a plasma process, before forming the photoresist layer. The method can be applied to the fabrication of semiconductor devices for increasing the removal rate of the photoresist layer.


Find Patent Forward Citations

Huang, Wen-Hsien. (2009). Method of fabricating semiconductor devices (U.S. Patent No. 7531434). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7531434

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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