The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7505337 B1

PDF
Full Text
Expired
Date of Patent:
Mar. 17, 2009

Filed:

Jan. 12, 2006
Applicants:

Janusz Jozef Nowak, Highland Mills, NY (US);

Mark Curtis Hayes Lamorey, South Burlington, VT (US);

Yu LU, Hopewell Junction, NY (US);

Inventors:

Janusz Jozef Nowak, Highland Mills, NY (US);

Mark Curtis Hayes Lamorey, South Burlington, VT (US);

Yu Lu, Hopewell Junction, NY (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G11C 29/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for repairing a shorted tunnel device includes the step of applying a stressing signal to the tunnel device. The stressing signal has an amplitude that is greater than an amplitude of a bias signal applied to the device during normal operation. One or more characteristics of the stressing signal are selected so as to substantially optimize a repair of the device. The amplitude and/or the duration of the stressing signal are preferably selected so as to remove a conductive filament shorting the device via a thermal mechanism (e.g., heating).


Find Patent Forward Citations

Nowak, Janusz. (2009). Method and apparatus for repairing a shorted tunnel device (U.S. Patent No. 7505337). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7505337

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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