The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 27, 2009
Filed:
May. 26, 2006
Valeri V. Raznikov, Moscow, RU;
J. Albert Schultz, Houston, TX (US);
Thomas F. Egan, Houston, TX (US);
Michael V. Ugarov, Houston, TX (US);
Agnès Tempez, Houston, TX (US);
Gennadiy Savenkov, Moscow, RU;
Vladislav Zelenov, Moscow, RU;
Valeri V. Raznikov, Moscow, RU;
J. Albert Schultz, Houston, TX (US);
Thomas F. Egan, Houston, TX (US);
Michael V. Ugarov, Houston, TX (US);
Agnès Tempez, Houston, TX (US);
Gennadiy Savenkov, Moscow, RU;
Vladislav Zelenov, Moscow, RU;
Ionwerks, Inc., Houston, TX (US);
Abstract
The content of the invention comprises a concept of multi-beam ion pre-selection from a single sample, coordinated mobility (against the gas flow) separation, cooling ions in supersonic gas flow and mass separation of thus low divergent ions by single or plural compact high-resolution orthogonal time-of-flight mass spectrometers both linear or reflectron type with controlled collision-induced dissociation (CID) and multi-channel data recording for the optimization of sample use in the analysis, and obtaining as much useful information about the sample as possible in a reasonably short time.