The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7469397 B1

PDF
Full Text
Expired
Date of Patent:
Dec. 23, 2008

Filed:

Oct. 04, 2005
Applicant:

Tamotsu Kitamura, Setagaya-Nagano, JP;

Inventor:

Tamotsu Kitamura, Setagaya-Nagano, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/50 (2006.01);
U.S. Cl.
CPC ...
Abstract

An automatic trace determination apparatus for automatically determining optimal positions of traces from pads to corresponding vias on a substrate using computation comprises: tentative determination means for tentatively determining a tentative target line with which tentative positions of bending points of traces are aligned; and final determination means for determining a final target line by correcting the tentative target line so that at least clearances between the adjacent traces and between the traces and vias adjacent to the corresponding traces can be secured, wherein the positions of intersection of the determined final target line and the traces from the pads are determined as bending points of the traces.


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Kitamura, Tamotsu. (2008). Automatic trace determination method and apparatus for automatically determining optimal trace positions on substrate using computation (U.S. Patent No. 7469397). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7469397

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