The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 16, 2008
Filed:
Sep. 14, 2006
George H. Chang, Taipei, TW;
Yi-kan Cheng, Taipei, TW;
Chen-teng Fan, Beipu Township, Hsinchu County, TW;
Chen-lin Yang, Hsinchu, TW;
Yung-chin Hou, Taipei, TW;
Chu-ping James Wang, Hsinchu, TW;
George H. Chang, Taipei, TW;
Yi-Kan Cheng, Taipei, TW;
Chen-Teng Fan, Beipu Township, Hsinchu County, TW;
Chen-Lin Yang, Hsinchu, TW;
Yung-Chin Hou, Taipei, TW;
Chu-Ping James Wang, Hsinchu, TW;
Taiwan Semiconductor Manufacturing Co., Hsin-Chu, TW;
Abstract
This invention discloses a method for sanity checking integrated circuit (IC) designs based on one or more predefined sub-circuits with at least one predefined checking criteria, the method comprising automatically reading one or more netlists, identifying one or more sub-circuits in the netlists isomorphic to at least one of predefined sub-circuits, identifying one or more device parameters for sanity checking the identified sub-circuits, and comparing the identified device parameters against the predefined checking criteria.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile