The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 02, 2008
Filed:
Aug. 23, 2006
John J. Pickerd, Hillsboro, OR (US);
Kan Tan, Beaverton, OR (US);
William A. Hagerup, Portland, OR (US);
Rolf P. Anderson, Portland, OR (US);
Sharon M. MC Masters, Sherwood, OR (US);
John J. Pickerd, Hillsboro, OR (US);
Kan Tan, Beaverton, OR (US);
William A. Hagerup, Portland, OR (US);
Rolf P. Anderson, Portland, OR (US);
Sharon M. Mc Masters, Sherwood, OR (US);
Tektronix, Inc., Beaverton, OR (US);
Abstract
A method and apparatus adapted to calibrate a signal path of a signal analysis system such that loading effects of the system are substantially removed from measurements of a device under test. A signal under test from the device under test is coupled to a test probe in the signal path and used with selectable impedance loads in the test probe to characterize transfer parameters of the device under test. An equalization filter in either the frequency or time domain is computed from the device under test transfer parameters for reducing in signal error attributable to the measurement loading of the device under test.