The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 02, 2008
Filed:
Apr. 25, 2002
Hiroto Nakamura, Tokyo, JP;
Hiroto Nakamura, Tokyo, JP;
Advantest Corporation, Tokyo, JP;
Abstract
An electronic device testing apparatus for conducting a test by pressing input/output terminals of electronic devices to be tested () against contact portions () of a test head () while holding the electronic devices to be tested () on electronic device conveying media (): wherein the electronic device testing apparatus comprises a test head () provided with a plurality of contact groups () made by sets of contact portions (), and a plurality of moving means capable of controlling independently from each other; and the respective moving means move the electronic device conveying media () loaded with the electronic devices to be tested () to corresponding contact groups () to conduct a test.