The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 25, 2008

Filed:

Jan. 07, 2005
Applicants:

Sandeep Bhatia, San Jose, CA (US);

Oriol Roig, Sunnyvale, CA (US);

Inventors:

Sandeep Bhatia, San Jose, CA (US);

Oriol Roig, Sunnyvale, CA (US);

Assignee:

Cadence Design Systems, Inc., San Jose, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01);
U.S. Cl.
CPC ...
Abstract

An improved scan register and methods of using the same have been disclosed. In one embodiment, the improved scan register includes a master latch having a data input, a data output, and a control input. The control input is coupled to a clock signal. The master latch is operable to store data. The improved scan register further includes a scan latch having a data input, a data output, and a control input. The data input of the scan latch is coupled to the data output of the master latch. The scan latch is operable to receive and to store the data from the master latch in response to the scan latch being in a scan mode. The improved scan register may further include a functional latch having a data input, a data output, and a control input. The data input of the functional latch is coupled to the data output of the master latch. The functional latch is operable to receive and to store the data from the master latch in response to the functional latch being in a functional mode. Other embodiments have been claimed and described.


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