The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 18, 2008

Filed:

Mar. 22, 2006
Applicant:

Tamotsu Kitamura, Nagano, JP;

Inventor:

Tamotsu Kitamura, Nagano, JP;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 17/50 (2006.01);
U.S. Cl.
CPC ...
Abstract

An automatic trace determination apparatus comprises: first means that performs a first process sequentially for all intersections formed between tentative traces connecting between pads and corresponding vias, wherein the first process determines distances from an intersection formed between two tentative traces to the corresponding vias, respectively, and allows one of the two tentative traces associated with the longer distance to bypass the via, with which the other of the two tentative traces associated with the shorter distance is connected; and second means that performs a second process sequentially for all intersections formed between the interim traces themselves or between the interim and tentative traces, wherein the second process determines distances from an intersection to the vias corresponding to the interim or tentative traces, respectively, and allows one of the two tentative or interim traces associated with the longer distance to bypass the via, with which the other of the two tentative or interim traces associated with the shorter distance is connected, and defines this bypass trace as an optimal trace.


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