The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 11, 2008

Filed:

Sep. 20, 2006
Applicants:

Jun Hatakeyama, Joetsu, JP;

Takeshi Nagata, Joetsu, JP;

Takanobu Takeda, Joetsu, JP;

Inventors:

Jun Hatakeyama, Joetsu, JP;

Takeshi Nagata, Joetsu, JP;

Takanobu Takeda, Joetsu, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G03F 7/039 (2006.01); G03F 7/30 (2006.01); G03C 1/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A polymer is obtained from (meth)acrylate having a bridged ring lactone group, (meth)acrylate having an acid-labile leaving group, and (meth)acrylate having a hydroxynaphthyl pendant. A positive resist composition comprising the polymer as a base resin, when exposed to high-energy radiation and developed, exhibits a high sensitivity, a high resolution, and a minimal line edge roughness due to controlled swell during development, and leaves minimal residues following development.


Find Patent Forward Citations

Hatakeyama, Jun. (2008). Positive resist compositions and patterning process (U.S. Patent No. 7449277). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7449277

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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