The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 28, 2008

Filed:

Apr. 28, 2005
Applicants:

William H. Radke, San Francisco, CA (US);

Shuba Swaminathan, Los Gatos, CA (US);

Brady L. Keays, Half Moon Bay, CA (US);

Inventors:

William H. Radke, San Francisco, CA (US);

Shuba Swaminathan, Los Gatos, CA (US);

Brady L. Keays, Half Moon Bay, CA (US);

Assignee:

Micron Technology, Inc., Boise, ID (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 29/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Improved memory devices, circuitry, and data methods are described that facilitate the detection and correction of data in memory systems or devices by encoding the data bits of a memory row or block in a non-systematic ECC code. This allows memory embodiments of the present invention to utilize reduced complexity error detection and correction hardware and/or routines to efficiently detect and correct corrupted user data in a segment of memory, such as a sector, word line row, or erase block. Additionally, in embodiments of the present invention user data is not stored in a plaintext format in the memory array, allowing for an increased level of data security. Further, in embodiments of the present invention, the ECC code is distributed throughout the stored data in the memory segment, increasing the robustness of the ECC code and its resistance to damage or data corruption.


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