The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 21, 2008
Filed:
May. 26, 2004
Eitan Cadouri, Cupertino, CA (US);
Eitan Cadouri, Cupertino, CA (US);
PDF Solutions, Inc., San Jose, CA (US);
Abstract
In one exemplary embodiment, yield information of semiconductor dice is mapped by obtaining yield information of a first die that was formed on a first location on a first wafer. Yield information is obtained of a second die that was formed on a second location on a second wafer. A portion of the first location corresponds to a portion of the second location such that the portion of the first location would overlap with the portion of the second location if the first location was on the second wafer. A plurality of pixel elements is defined. Each pixel element corresponds to a different location on a wafer, and at least one of the plurality of pixel elements corresponds to the portion of the first location that corresponds to the portion of the second location. An average yield is determined for the at least one of the plurality of pixel elements based on the yield information of the first die and the second die. A deviation is determined for the at least one of the plurality of pixel elements based on the average yield of the at least one of the plurality of pixel elements and the yield information of the first die and the second die.