The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 14, 2008
Filed:
Aug. 25, 2005
Janusz Rajski, West Linn, OR (US);
Grzegorz Mrugalski, Wilsonville, OR (US);
Artur Pogiel, 89-200 Szubin, PL;
Jerzy Tyszer, 61-249 Poznan, PL;
Chen Wang, Tigard, OR (US);
Janusz Rajski, West Linn, OR (US);
Grzegorz Mrugalski, Wilsonville, OR (US);
Artur Pogiel, 89-200 Szubin, PL;
Jerzy Tyszer, 61-249 Poznan, PL;
Chen Wang, Tigard, OR (US);
Other;
Abstract
Methods, apparatus, and systems for diagnosing failing scan cells from compressed test responses are disclosed herein. For example, in one nonlimiting exemplary embodiment, a compactor for compacting test responses in a circuit-under-test is disclosed. In this embodiment, the compactor includes an injector network comprising combinational logic and includes injector-network outputs and injector-network inputs. At least some of the injector-network inputs are logically coupled to two or more injector-network outputs according to respective injector polynomials. The exemplary compactor further comprises a selection circuit that includes selection-circuit outputs coupled to the injector-network inputs and selection-circuit inputs coupled to scan-chain outputs of the circuit-under-test. The selection circuit is configured to selectively route signals from the scan-chain outputs to the injector-network inputs according to one of plural different input configurations.