The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 07, 2008

Filed:

Feb. 20, 2007
Applicants:

Sangbong Park, Union City, CA (US);

Duan-fu Stephen Hsu, Fremont, CA (US);

Edita Tejnil, Cupertino, CA (US);

Inventors:

Sangbong Park, Union City, CA (US);

Duan-Fu Stephen Hsu, Fremont, CA (US);

Edita Tejnil, Cupertino, CA (US);

Assignee:

ASML Masktools B.V., Veldhoven, NL;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01D 18/00 (2006.01); G01B 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method of calibrating a simulation model of a photolithography process. The method includes the steps of defining a set of input data; defining a simulation model having model parameters which affect the simulation result produced by the simulation model; performing a first stage calibration process in which the model parameters and alignment parameters are adjusted such that the simulation result is within a first predefined error tolerance; and performing a second stage calibration process in which the alignment parameters are fixed and the model parameters are adjusted such that the simulation result is within a second predefined error tolerance.


Find Patent Forward Citations

Park, Sangbong. (2008). Method of performing multiple stage model calibration for optical imaging simulation models (U.S. Patent No. 7433791). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7433791

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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