The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 30, 2008
Filed:
May. 26, 2006
J. Albert Schultz, Houston, TX (US);
Valeri V. Raznikov, Moscow, RU;
Thomas F. Egan, Houston, TX (US);
Michael V. Ugarov, Houston, TX (US);
Agnès Tempez, Houston, TX (US);
Marina O. Raznikova, Moscow, RU;
Valentin A. Tarasenko, Chernoglovka, RU;
J. Albert Schultz, Houston, TX (US);
Valeri V. Raznikov, Moscow, RU;
Thomas F. Egan, Houston, TX (US);
Michael V. Ugarov, Houston, TX (US);
Agnès Tempez, Houston, TX (US);
Marina O. Raznikova, Moscow, RU;
Valentin A. Tarasenko, Chernoglovka, RU;
Ionwerks, Inc., Houston, TX (US);
Abstract
The present invention relates generally to instrumentation and methodology for the characterization of chemical samples in solutions or on a surface which is based on modified ionization methods with or without adjustable pH and controllable H-D exchange in solution, in improved ion mobility spectrometer (IMS), a multi-beam ion per-selection of the initial flow, and coordinated mobility and mass ion separation and detection using a single or several independent time-of-flight mass spectrometers for different beams with methods for fragmenting ion mobility-separated ions and multi-channel data recording.