The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 09, 2008
Filed:
Oct. 05, 2006
Susumu Kasukabe, Yokohama, JP;
Teruo Shoji, Mitaka, JP;
Akio Hasebe, Kodaira, JP;
Yoshinori Deguchi, Inagawa, JP;
Yasunori Narizuka, Hiratsuka, JP;
Susumu Kasukabe, Yokohama, JP;
Teruo Shoji, Mitaka, JP;
Akio Hasebe, Kodaira, JP;
Yoshinori Deguchi, Inagawa, JP;
Yasunori Narizuka, Hiratsuka, JP;
Renesas Technology Corp., Tokyo, JP;
Abstract
In a prove card comprising: a probe sheet having a contact terminal contacting with an electrode provided on a wafer, a wiring led from the contact terminal, and an electrode electrically connected to the wiring; and a multilayered wiring substrate having an electrode electrically connected to the electrode of the probe sheet, wherein a contact between the contact terminal and the electrode of the wafer is established by one or more adhesion holder for pressing, from the backside of a terminal group of the terminal contacts, the terminal group via a press block with a spring to contact with the electrode pad. A device in which the probe sheet is attached to the adhesion holder and a plurality of chips are tested simultaneously by combining the adhesion holder.