The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7414417 B1

PDF
Full Text
Expired
Date of Patent:
Aug. 19, 2008

Filed:

Jul. 08, 2004
Applicants:

Naoko Yamaguchi, Yokohama, JP;

Hideo Aoki, Yokohama, JP;

Chiaki Takubo, Tokyo, JP;

Toshiro Hiraoka, Yokohama, JP;

Yasuyuki Hotta, Tokyo, JP;

Shigeru Matake, Yokohama, JP;

Inventors:

Naoko Yamaguchi, Yokohama, JP;

Hideo Aoki, Yokohama, JP;

Chiaki Takubo, Tokyo, JP;

Toshiro Hiraoka, Yokohama, JP;

Yasuyuki Hotta, Tokyo, JP;

Shigeru Matake, Yokohama, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/02 (2006.01); H01L 21/66 (2006.01); B23K 31/02 (2006.01);
U.S. Cl.
CPC ...
Abstract

According to one aspect of the invention, a contact sheet for testing electronic parts, comprising an insulating porous layer; and a connection electrode which is disposed on the insulating porous layer and electrically connect the electrode or terminal of the electronic parts and the terminal of a test apparatus; wherein the connection electrode is embedded below at least one main surface of the insulating porous layer.


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Yamaguchi, Naoko. (2008). Contact sheet for testing electronic parts, apparatus for testing electronic parts, method for testing electronic parts, method for manufacturing electronic parts and electronic parts (U.S. Patent No. 7414417). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7414417

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