The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 08, 2008
Filed:
May. 11, 2006
Zhen Hou, Milpitas, CA (US);
Ronny Soetarman, Fremont, CA (US);
Vamsi Velidandla, San Jose, CA (US);
Steven W. Meeks, Fremont, CA (US);
Zhen Hou, Milpitas, CA (US);
Ronny Soetarman, Fremont, CA (US);
Vamsi Velidandla, San Jose, CA (US);
Steven W. Meeks, Fremont, CA (US);
KLA-Tencor Technologies Corporation, Milpitas, CA (US);
Abstract
In one embodiment, a surface analyzer system comprises a radiation targeting assembly to target radiation onto a surface, a reflected radiation collecting assembly that collects radiation reflected from the surface, and a signal processing module. The signal processing module generates an image of magnetic characteristics of the magnetic disk, wherein the image comprises a plurality of servo sector arcs, locates a sample of points on a plurality of the servo sector arcs, fits a circle to the sample of points on each of the plurality of servo sector arcs, and determines at least one pivot-to-gap measurement from the radius of the circles.